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VSF Documented
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#include <vsf_test.h>
Data Fields | ||
| vsf_peripheral_type_t | peripheral_type | |
| which HAL interface this instance satisfies | ||
| const char * | name | |
| human-readable instance description for logs | ||
| union { | ||
| void * raw | ||
| generic fallback / pass-through More... | ||
| vsf_i2c_t * i2c | ||
| vsf_usart_t * usart | ||
| vsf_spi_t * spi | ||
| vsf_adc_t * adc | ||
| vsf_pwm_t * pwm | ||
| vsf_dma_t * dma | ||
| vsf_timer_t * timer | ||
| vsf_rtc_t * rtc | ||
| vsf_flash_t * flash | ||
| vsf_wdt_t * wdt | ||
| vsf_rng_t * rng | ||
| vsf_gpio_t * gpio | ||
| vsf_test_i2c_slave_ctx_t * i2c_slave | ||
| vsf_test_gpio_pinmux_ctx_t * gpio_pinmux | ||
| } | fixture | |
| typed hardware fixture passed to test suites | ||
| vsf_peripheral_type_t vsf_test_inst_t::peripheral_type |
which HAL interface this instance satisfies
| const char* vsf_test_inst_t::name |
human-readable instance description for logs
| void* vsf_test_inst_t::raw |
generic fallback / pass-through
| vsf_i2c_t* vsf_test_inst_t::i2c |
| vsf_usart_t* vsf_test_inst_t::usart |
| vsf_spi_t* vsf_test_inst_t::spi |
| vsf_adc_t* vsf_test_inst_t::adc |
| vsf_pwm_t* vsf_test_inst_t::pwm |
| vsf_dma_t* vsf_test_inst_t::dma |
| vsf_timer_t* vsf_test_inst_t::timer |
| vsf_rtc_t* vsf_test_inst_t::rtc |
| vsf_flash_t* vsf_test_inst_t::flash |
| vsf_wdt_t* vsf_test_inst_t::wdt |
| vsf_rng_t* vsf_test_inst_t::rng |
| vsf_gpio_t* vsf_test_inst_t::gpio |
| vsf_test_i2c_slave_ctx_t* vsf_test_inst_t::i2c_slave |
| vsf_test_gpio_pinmux_ctx_t* vsf_test_inst_t::gpio_pinmux |
| union { ... } vsf_test_inst_t::fixture |
typed hardware fixture passed to test suites