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VSF Documented
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#include <vsf_test.h>
Data Fields | ||
| struct { | ||
| vsf_test_wdt_t internal | ||
| vsf_test_wdt_t external | ||
| } | wdt | |
| struct { | ||
| vsf_test_reboot_t * internal | ||
| Use the chip's internal reset, possibly a hot reset. More... | ||
| vsf_test_reboot_t * external | ||
| } | reboot | |
| vsf_test_data_t | data | |
| jmp_buf * | jmp_buf | |
| bool | restart_on_done | |
| Restart from the beginning when test completes or errors occur. | ||
| uint32_t | test_case_count | |
| Test case count (number of test cases added) | ||
| vsf_test_case_t | test_case_array [VSF_TEST_CFG_ARRAY_SIZE] | |
| Test case array. | ||
| vsf_test_wdt_t vsf_test_t::internal |
internal watchdog means the watchdog inside the device
| vsf_test_wdt_t vsf_test_t::external |
Use an external method to implement a watchdog, possibly via the reset pin or the device's power pin.
| struct { ... } vsf_test_t::wdt |
Without a watchdog, we can still can test. But the watchdog provides stronger guarantees for tests: if a test is abnormal, the next test continues to run after the watchdog times out.
| vsf_test_reboot_t* vsf_test_t::internal |
Use the chip's internal reset, possibly a hot reset.
| vsf_test_reboot_t* vsf_test_t::external |
Use an external method to reset, possibly via the reset pin or the device's power pin.
| struct { ... } vsf_test_t::reboot |
We perform a reset when the test program goes into exception.
| vsf_test_data_t vsf_test_t::data |
Persistent data, each time the data in this structure is modified it should be actively synchronized to the assist device
| jmp_buf* vsf_test_t::jmp_buf |
| bool vsf_test_t::restart_on_done |
Restart from the beginning when test completes or errors occur.
| uint32_t vsf_test_t::test_case_count |
Test case count (number of test cases added)
| vsf_test_case_t vsf_test_t::test_case_array[VSF_TEST_CFG_ARRAY_SIZE] |
Test case array.