vsf_test_t Struct Reference

#include <vsf_test.h>

Data Fields
struct {
vsf_test_wdt_t   internal
vsf_test_wdt_t   external
}	wdt
struct {
vsf_test_reboot_t *   internal
	Use the chip's internal reset, possibly a hot reset. More...
vsf_test_reboot_t *   external
}	reboot
vsf_test_data_t	data
jmp_buf *	jmp_buf
struct {
uint32_t   size
uint32_t   offset
vsf_test_case_t *   array
}	test_case
	Information for each test.

Field Documentation

internal [1/2]

vsf_test_wdt_t vsf_test_t::internal

internal watchdog means the watchdog inside the device

external [1/2]

vsf_test_wdt_t vsf_test_t::external

Use an external method to implement a watchdog, possibly via the reset pin or the device's power pin.

[struct]

struct { ... } vsf_test_t::wdt

Without a watchdog, we can still can test. But the watchdog provides stronger guarantees for tests: if a test is abnormal, the next test continues to run after the watchdog times out.

internal [2/2]

vsf_test_reboot_t* vsf_test_t::internal

Use the chip's internal reset, possibly a hot reset.

external [2/2]

vsf_test_reboot_t* vsf_test_t::external

Use an external method to reset, possibly via the reset pin or the device's power pin.

[struct]

struct { ... } vsf_test_t::reboot

We perform a reset when the test program goes into exception.

1. First execute the external reset function.
2. If the external reset is not successful, then we continue to execute the internal reset function.
3. If the internal reset is not successful, then we enter a dead loop and wait for the watchdog to reset.

data

vsf_test_data_t vsf_test_t::data

Persistent data, each time the data in this structure is modified it should be actively synchronized to the assist device

jmp_buf

jmp_buf* vsf_test_t::jmp_buf

size

uint32_t vsf_test_t::size

offset

uint32_t vsf_test_t::offset

array

vsf_test_case_t* vsf_test_t::array

[struct]

struct { ... } vsf_test_t::test_case

Information for each test.